NFR Polaris S160

Beyond Innovation
for the Future of Healthcare

NFR Polaris S160

High resolution 2D/3D Imaging for Non-destructive inspection applications

Non-invasive, visualization at micron level with sub-micron feature recognition
Easy-to-use X-Ray Inspection System
Anti-collision design for damage-free inspection
Detail detectability down to < 1um
Highest magnification of up to 100x (geometric)
Slip-ring technology for continuous rotation
The sample can be manipulated with 6 axes of freedom
NanoFocusRay Co., Ltd. Offers NFR Polaris-S series of
sub-micro CT scanners dedicated for high resolution imaging

Applications

PCM,CGA,BGA,Multi-layer PCB,Flexibel PCB, Thin layer
Small electronics, Mechanical components, Materials
IC Packaging,Composites, Polymers, Diamond, Foods, Seeds,Wood
Paper,MEMS,Reverse engineering,Fiber optics and medical Devices

Specifications

X-ray source	~160kV, ~1mA, 2.5um spot size, Open tube
X-ray detector	4 Mega pixel 12bit digital Flat panel detector, GOS-deposited FOP Scintillator or Direct coupled fiber-optic CCD (4008 x 2672)
Magnification	up to 100x
Detail detestability	<1um Pixel size@Max.magnification
Sample stage	6 D.O.F, Linear 5-axis and rotation Θ-axis, Travel 500mm x 40mm x 10mm, 360° in full rotation
Sample size	Max. Ф150mm ~ Ф1mm (CT)
Reconstruction	Fledkamp algorithm
Radiation safety	<1uSv/h at any point on the instrument surface
Size /weight	1,700(W)x1,500(D)x2200(H)mm / 1800kg

Software

Powerful Control and 3D Volume viewer

System control and image acquisition
Volume scanning, Fast scanning and short reconstruction times
3D Rendering Viewer
Fast volume rendering performance
Advanced easy to use 3D and 2D segmentation tools
Powerful key framer to generate animations
Iso-surfaces extraction with STL export for Rapid Prototyping and Reverse Engineering processes